SR250 Gated Integrator

  • Manufactured by: SRS Stanford Research Systems

Quick Overview

  • Gate width from 2 ns to 15 µs
    (expandable to 150 µsec)
  • Internal rate generator
  • Active baseline subtraction
  • Shot-by-shot output
  • Gate output for precise gate timing
  • Average 1 to 10,000 samples
  • DC to 20 kHz repetition rate
  • Low jitter (<20 ps ..

Description

  • Gate width from 2 ns to 15 µs
    (expandable to 150 µsec)
  • Internal rate generator
  • Active baseline subtraction
  • Shot-by-shot output
  • Gate output for precise gate timing
  • Average 1 to 10,000 samples
  • DC to 20 kHz repetition rate
  • Low jitter (<20 ps + 0.01% of delay)

The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds.

The SR250 consists of a gate generator, a fast gated integrator, and exponential averaging circuitry. The gate generator, triggered internally or externally, provides an adjustable delay from a few nanoseconds to 100 ms before it generates a continuously adjustable gate with a width between 2 ns and 15 µs. The gate delay can be set from the front panel or automatically scanned by applying a rear-panel control voltage. Scanning the gate allows the recovery of entire waveforms.

The fast gated integrator integrates the input signal during the gate. The output from the integrator is then normalized by the gate width to provide a voltage proportional to the average of the input signal during the sampling gate. This signal is further amplified and sampled by a low-droop sample-and-hold amplifier, and output via a front-panel BNC connector. The last sample output provides a shot-by-shot analysis of the signal, and makes the instrument a particularly useful component in a computer data acquisition system

Datasheet (PDF file)

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Manufacturer Informations

SRS Stanford Research Systems

    Formed in 1980, SRS is a privately held corporation which designs and manufactures high performance test equipment.


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