SR200 Gate Scanner

  • Manufactured by: SRS Stanford Research Systems

Quick Overview

The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage need..

Description

The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage needed to scan the gates using these inputs. The initial and final delays, as well as the scan time, are fully adjustable. Single or repeated scans may be performed in the forward or reverse direction over any portion of the waveform. Scan times from 10 milliseconds to 5 minutes may be selected.

In addition to the delay control output, the SR200 has a 0 to 10 volt X-axis ramp output designed to drive the X-axis of a chart recorder or an oscilloscope.

Gate scanner for SR250 and SR255
Forward/reverse scans
Repeat/single-shot scans
Pen lift output
Scan times from 10 ms to 5 minutes
Variable scan width control

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Manufacturer Informations

SRS Stanford Research Systems

    Formed in 1980, SRS is a privately held corporation which designs and manufactures high performance test equipment.


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