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SR250 Gated Integrator

Manufactured by: SRS Stanford Research Systems

Quick Overview

Gate width from 2 ns to 15 µs
(expandable to 150 µsec)
Internal rate generator
Active baseline subtraction
Shot-by-shot output
Gate output for precise gate timing
Average 1 to 10,000 samples
DC to 20 kHz repetition rate
Low jitter (<20 ps ..

Description

Description

Gate width from 2 ns to 15 µs
(expandable to 150 µsec)
Internal rate generator
Active baseline subtraction
Shot-by-shot output
Gate output for precise gate timing
Average 1 to 10,000 samples
DC to 20 kHz repetition rate
Low jitter (<20 ps + 0.01% of delay)

The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds.

The SR250 consists of a gate generator, a fast gated integrator, and exponential averaging circuitry. The gate generator, triggered internally or externally, provides an adjustable delay from a few nanoseconds to 100 ms before it generates a continuously adjustable gate with a width between 2 ns and 15 µs. The gate delay can be set from the front panel or automatically scanned by applying a rear-panel control voltage. Scanning the gate allows the recovery of entire waveforms.

The fast gated integrator integrates the input signal during the gate. The output from the integrator is then normalized by the gate width to provide a voltage proportional to the average of the input signal during the sampling gate. This signal is further amplified and sampled by a low-droop sample-and-hold amplifier, and output via a front-panel BNC connector. The last sample output provides a shot-by-shot analysis of the signal, and makes the instrument a particularly useful component in a computer data acquisition system